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X‐ray diffraction powder data of some thiol esters of long chain fatty acids
Author(s) -
Witnauer L. P.,
Lutz D. A.,
Sasin G. S.,
Sasin R.
Publication year - 1957
Publication title -
journal of the american oil chemists' society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.512
H-Index - 117
eISSN - 1558-9331
pISSN - 0003-021X
DOI - 10.1007/bf02638021
Subject(s) - thiol , chemistry , fatty acid , long chain , powder diffraction , organic chemistry , diffraction , hydrocarbon , long chain fatty acid , x ray crystallography , crystallography , optics , physics , polymer science
Summary X‐ray diffraction powder data were obtained for 14 thiol esters of long chain fatty acids including benzyl, β‐naphthyl, n ‐amyl, and n ‐hexyl thiol myristates; thiol palmitates; thiol stearates; and in some cases thiol laurates. All the individual compounds can be readily distinguished and identified by the diffraction data. Long spacings increase regularly with increase in hydrocarbon chain length. The benzyl and β‐naphthyl thiol esters crystallize in tilted bimolecular layers while the n ‐amyl and n ‐hexyl thiol derivatives crystallize in tilted monomolecular layers.

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