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X‐ray diffraction study of some normal alkyl thiolesters of long chain acids
Author(s) -
Lutz D. A.,
Witnauer L. P.,
Sasin George S.,
Sasin Richard
Publication year - 1959
Publication title -
journal of the american oil chemists' society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.512
H-Index - 117
eISSN - 1558-9331
pISSN - 0003-021X
DOI - 10.1007/bf02636972
Subject(s) - alkyl , molecule , carbon chain , chemistry , diffraction , crystallography , stearic acid , x ray crystallography , carbon fibers , lauric acid , x ray , myristic acid , powder diffraction , palmitic acid , stereochemistry , organic chemistry , materials science , fatty acid , physics , optics , composite number , composite material
Summary X‐ray diffraction‐powder data are reported for 39 n ‐alkyl thiolesters comprising four different series, namely, lauric, myristic, palmitic, and stearic acids. All individual compounds can be identified and distinguished by the X‐ray diffraction data. Compounds containing the same total number of carbon atoms in the molecule have the same long and side spacings but differ in the relative intensities of the various orders of the long spacings. The esters crystallize in tilted monomolecular layers. The long spacing is a function of the total carbon content of the molecule and forms two series, one for the odd members and one for the even members. A change in the structure‐type definitely occurs in the odd series on decreasing alkyl chain‐length below 9 carbons.