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Reliability of the beam with variable cross‐section under stochastic excitation
Author(s) -
MazurSniady K.,
Sniady P.
Publication year - 2001
Publication title -
zamm ‐ journal of applied mathematics and mechanics / zeitschrift für angewandte mathematik und mechanik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.449
H-Index - 51
eISSN - 1521-4001
pISSN - 0044-2267
DOI - 10.1002/zamm.20010811595
Subject(s) - reliability (semiconductor) , beam (structure) , variable (mathematics) , probabilistic logic , excitation , section (typography) , random variable , cross section (physics) , mathematics , geometry , physics , mathematical analysis , computer science , optics , statistics , quantum mechanics , power (physics) , operating system
The paper presents the problem of reliability of a beam with periodically variable geometry under stochastic excitation. The approach is based on concepts of the nonasymptotic tolerance averaged model ]3[. In this way we formulated the averaged equations of the structured beam which describe the length‐scale effect ]1,2[. Using these averaged equations we obtain the probabilistic characteristics of the beam with periodically variable geometry. We will solve the problem of reliability of this beam as the problem of the first crossing.