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Fitting of Experimental Yield Surfaces
Author(s) -
Gupta N. K.,
Meyers A.
Publication year - 1990
Publication title -
zamm ‐ journal of applied mathematics and mechanics / zeitschrift für angewandte mathematik und mechanik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.449
H-Index - 51
eISSN - 1521-4001
pISSN - 0044-2267
DOI - 10.1002/zamm.19900700305
Subject(s) - yield (engineering) , yield surface , von mises yield criterion , surface (topology) , tensor (intrinsic definition) , ellipse , distortion (music) , translation (biology) , rotation (mathematics) , function (biology) , mathematics , mathematical analysis , geometry , materials science , physics , thermodynamics , chemistry , finite element method , amplifier , constitutive equation , biochemistry , optoelectronics , cmos , evolutionary biology , biology , messenger rna , gene
To be able to describe experimentally observed deviations in the initial yield surface from the von Mises ellipse as well as translation, rotation and distortion of a subsequent yield surface, a function of the second and third invariants of the translated deviator stress tensor was proposed in an earlier paper [ 1 ]. This relationship is further considered, and the manner in which various encountered parameters influence the fitting of an experimentally determined yield surface, is discussed. The experimental data employed in illustrations is taken from literature.