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Spencer, B. F. Jr., Reliability of Randomly Excited Hysteretic Structures. Berlin etc., Springer‐Verlag 1986. XIII, 138 S., DM 34.‐. ISBN 3‐540‐16863‐X (Lecture Notes in Engineering 21)
Author(s) -
Lange C.
Publication year - 1987
Publication title -
zamm ‐ journal of applied mathematics and mechanics / zeitschrift für angewandte mathematik und mechanik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.449
H-Index - 51
eISSN - 1521-4001
pISSN - 0044-2267
DOI - 10.1002/zamm.19870671104
Subject(s) - citation , reliability (semiconductor) , engineering physics , library science , mathematics , physics , humanities , computer science , philosophy , quantum mechanics , power (physics)