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Description of Initial and Subsequent Yield Surfaces
Author(s) -
Gupta N. K.,
Meyers A.
Publication year - 1986
Publication title -
zamm ‐ journal of applied mathematics and mechanics / zeitschrift für angewandte mathematik und mechanik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.449
H-Index - 51
eISSN - 1521-4001
pISSN - 0044-2267
DOI - 10.1002/zamm.19860660914
Subject(s) - yield (engineering) , yield surface , von mises yield criterion , ellipse , tensor (intrinsic definition) , surface (topology) , translation (biology) , rotation (mathematics) , mathematics , function (biology) , geometry , physics , thermodynamics , chemistry , constitutive equation , biochemistry , finite element method , evolutionary biology , biology , messenger rna , gene
A function of second and third invariants of the translated deviator stress tensor is proposed for the description of experimentally observed deviations from the von Mises ellipse in the initial yield surface, as well as from translation, rotation or change in size and shape of a subsequent yield surface. Application of the proposed relation is demonstrated by comparing it with some experimental data taken from the literature.