Premium
MCX: a Synchrotron Radiation Beamline for X‐ray Diffraction Line Profile Analysis
Author(s) -
Rebuffi Luca,
Plaisier Jasper R.,
Abdellatief Mahmoud,
Lausi Andrea,
Scardi Paolo
Publication year - 2014
Publication title -
zeitschrift für anorganische und allgemeine chemie
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.354
H-Index - 66
eISSN - 1521-3749
pISSN - 0044-2313
DOI - 10.1002/zaac.201400163
Subject(s) - beamline , synchrotron radiation , diffraction , optics , synchrotron , x ray crystallography , x ray , line (geometry) , physics , materials science , beam (structure) , geometry , mathematics
The potential of modern methods for X‐ray diffraction Line Profile Analysis can be fully exploited with data collected at synchrotron radiation beamlines, provided that optics and experimental set‐up are suitably designed and characterized. The Material Characterization by X‐ray Diffraction beamline, MCX, at Elettra‐Sincrotrone Trieste, may operate with a set‐up optimally arranged to study nanostructured materials, investigating details of crystalline domain size and shape, lattice defects, and local atomic displacement of static and dynamic nature. Main features of MCX are briefly discussed and best operating conditions illustrated by representative case studies.