Structure of Turbostratically Disordered Misfit Layer Compounds [(PbSe) 0.99 ] 1 [WSe 2 ] 1 , [(PbSe) 1.00 ] 1 [MoSe 2 ] 1 , and [(SnSe) 1.03 ] 1 [MoSe 2 ] 1

The structures of three new misfit layer compounds, [(PbSe) 0.99 ] 1 [WSe 2 ] 1 , [(PbSe) 1.00 ] 1 [MoSe 2 ] 1 , and [(SnSe) 1.03 ] 1 [MoSe 2 ] 1 , prepared as thin films from designed elementally modulated reactant precursors, have been investigated by synchrotron X‐ray diffraction and scanning transmission electron microscopy. This is the second report of a misfit layer compound based on tin selenide and the first structure determinations of tungsten‐ and molybdenum‐containing misfit layer compounds. The compounds have mismatches in both the a ‐ and b ‐axis (in‐plane) lattice parameters of the component structural units, which result in misfit parameters, δ , both greater and smaller than zero. Pole figures of hk 0‐type reflections indicate that c ‐axis‐oriented (basal plane) dichalcogenide‐structured units are randomly oriented within the a ‐ b plane. The widths of diffraction peaks of type hk 0, 00 l , and hkl ( h , k ≠ 0; l ≠ 0) indicate coherence lengths of approximately (6 to 7) nm within the a ‐ b plane, the full thickness of the film along the c ‐axis, and (1 to 2) nm in mixed‐index directions, respectively, consistent with random rotational disorder between the constituents, commonly termed turbostratic disorder in the clay literature. The intensities of 00 l ‐ and hk 0‐type diffraction peaks were modeled to determine the structure of atomic planes along the c axis and the projection of the constituent structures onto the a ‐ b plane, respectively.