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ThSi 2 Type Ytterbium Disilicide and its Analogues Yb T x Si 2– x ( T = Cr, Fe, Co)
Author(s) -
Peter Sebastian C.,
Kanatzidis Mercouri G.
Publication year - 2012
Publication title -
zeitschrift für anorganische und allgemeine chemie
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.354
H-Index - 66
eISSN - 1521-3749
pISSN - 0044-2313
DOI - 10.1002/zaac.201100284
Subject(s) - ytterbium , intermetallic , crystallography , materials science , transition metal , indium , crystal structure , lattice constant , silicon , bond length , metal , diffraction , chemistry , metallurgy , doping , alloy , catalysis , optics , physics , optoelectronics , biochemistry
YbSi 2 and the derivatives Yb T x Si 2– x ( T = Cr, Fe, Co) crystallizing in the α‐ThSi 2 structure type were obtained as single crystals from reactions run in liquid indium. All silicides were investigated by single‐crystal X‐ray diffraction, I 4 1 / amd space group and the lattice constants are: a = 3.9868(6) Å and c = 13.541(3) Å for YbSi 2 , a = 4.0123(6) Å and c = 13.542(3) Å for YbCr 0.27 Si 1.73 , a = 4.0142(6) Å and c = 13.830(3) Å for YbCr 0.71 Si 1.29 , a = 4.0080(6) Å and c = 13.751(3) Å for YbFe 0.34 Si 1.66 , and a = 4.0036(6) Å, c = 13.707(3) Å for YbCo 0.21 Si 1.79 . YbSi 2 and Yb T x Si 2– x compounds are polar intermetallics with three‐dimensional Si and M ( T +Si) polyanion sub‐networks, respectively, filled with ytterbium atoms. The degree of substitution of transition metal at the silicon site is signficant and leads to changes in the average bond lengths and bond angles substantially.