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Chemical speciation via X‐ray emission spectra
Author(s) -
Ankudinov A. L.,
Elam W. T.,
Sieber J. R.,
Rehr J. J.
Publication year - 2006
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.913
Subject(s) - monochromator , spectral line , emission spectrum , chemistry , analytical chemistry (journal) , spectrometer , spectroscopy , yield (engineering) , ab initio , oxidation state , wavelength , materials science , physics , optics , biochemistry , organic chemistry , chromatography , quantum mechanics , astronomy , catalysis , metallurgy
Since the early days of X‐ray spectrometry, X‐ray emission and fluorescence spectra have been used to investigate chemical speciation, e.g. the dependence on the formal oxidation state. Laboratory wavelength‐dispersive spectrometers have adequate resolution for these measurements. However, almost all studies have employed empirical methods to interpret the spectra. We aim to place such methods on a quantitative basis by means of efficient ab initio calculations of the X‐ray emission line shapes based on a self‐consistent, real‐space Green's function approach, as implemented in the X‐ray spectroscopy code FEFF8.2. Calculations are presented for the phosphorus K‐M 2, 3 , and the chromium L‐series emission lines for a selection of simple compounds. These lines exhibit changes depending on the oxidation state and on the neighboring atoms in the compounds that can be observed with instruments available in many XRF laboratories. The calculated spectra, as modified by convolution with a model monochromator response function, are compared with measured spectra. Simulated and measured spectra are found to be in reasonable agreement, and show that the approach has the potential to yield quantitative information about the chemical state. Copyright © 2006 John Wiley & Sons, Ltd.