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Measurement of background components in wavelength dispersive X‐ray fluorescence spectrometry
Author(s) -
Verkhovodov Petro O.
Publication year - 2006
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.910
Subject(s) - collimator , x ray , optics , wavelength , beam (structure) , spectrometer , scattering , radiation , x ray fluorescence , detector , excited state , intensity (physics) , crystal (programming language) , mass spectrometry , materials science , analytical chemistry (journal) , physics , fluorescence , chemistry , atomic physics , chromatography , computer science , programming language , quantum mechanics
Three components of the background have been investigated: first, characteristic radiation of the lamellas of the collimator excited by secondary x‐ray beam; second, secondary x‐ray beam scattered by the lamellas of the collimator; third, diffusive and incoherent scattering of the secondary x‐ray beam by the focusing crystal. The relationships between chemical content of the specimen and the intensity of the first and the second components were determined by a wavelength‐dispersive x‐ray spectrometer that has an energy‐dispersive x‐ray detector. The intensity of the third component was very low. It was not found in this experiment. Copyright © 2006 John Wiley & Sons, Ltd.