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High‐energy polarized‐beam EDXRF for trace metal analysis of vegetation samples in environmental studies
Author(s) -
Marguí E.,
Padilla R.,
Hidalgo M.,
Queralt I.,
Van Grieken R.
Publication year - 2006
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.890
Subject(s) - vegetation (pathology) , attenuation , certified reference materials , beam (structure) , trace (psycholinguistics) , environmental science , interference (communication) , sensitivity (control systems) , x ray fluorescence , excitation , analytical chemistry (journal) , environmental chemistry , chemistry , fluorescence , computer science , detection limit , physics , optics , chromatography , engineering , electronic engineering , telecommunications , medicine , linguistics , philosophy , channel (broadcasting) , pathology , quantum mechanics
The aim of this work was to achieve improved instrumental sensitivity and detection limits for the determination of several trace elements (Cd, Pb, As, Cu, Fe and Zn) in different vegetation species collected at two mining areas in Spain (Aran Valley and Cartagena) by using new instrumentation based on high‐energy polarized‐beam energy‐dispersive x‐ray fluorescence analysis. Cd was determined by using its Kα line, while the mutual interference of As and Pb was solved by employing selective excitation conditions with targets of different materials. The use of a standardless fundamental parameter approach (IAEA QXAS) allowed the determination of other metals in the absence of suitable certified reference materials and to compensate accurately for self‐attenuation effects in the sample. The proposed methodology provides an alternative analytical tool to classical destructive analytical methods, commonly applied for the determination of these toxic elements in vegetation matrices, with accuracy and precision levels fulfilling the requirements for environmental studies. Copyright © 2006 John Wiley & Sons, Ltd.