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EDXRF determination of impurities in potassium dihydrogenphosphate single crystals and raw materials
Author(s) -
Belikov K. N.,
Mikhailova L. I.,
Spolnik Z. M.,
Van Grieken R.
Publication year - 2005
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.874
Subject(s) - impurity , detection limit , raw material , adsorption , potassium , aqueous solution , chemistry , carbon fibers , activated carbon , analytical chemistry (journal) , fluorescence , cartridge , filter paper , chromatography , materials science , metallurgy , organic chemistry , physics , quantum mechanics , composite number , composite material
A fast and simple preconcentration procedure for recovering various cation impurities from potassium dihydrogenphosphate (KDP) single crystals and raw materials, followed by energy‐dispersive X‐ray fluorescence analysis (EDXRF), is described. The technique is based on the adsorption of metal 8‐hydroxyquinoline complexes from aqueous solutions of KDP on activated carbon, separation of the concentrate on a Nuclepore filter and subsequent determination by EDXRF. To fix activated carbon powder on a filter surface, an amount of 1‐hexadecanol is added to the KDP solution during the preconcentration procedure. The optimum conditions for the best recovery of the impurities were established. It was shown that a preconcentration factor of 100 can be achieved and the detection limit for a number of elements was down to 0.01 µg g −1 . The relative standard deviations were 6–17% for element concentrations of 0.2 µg g −1 . The method was successfully applied to the determination of Fe, Co, Cu, Ni, Zn, Mn, Ti and Bi in KDP single crystals and raw materials. Copyright © 2005 John Wiley & Sons, Ltd.