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X‐ray absorption and x‐ray fluorescence for the characterization of titanium oxide‐modified HPLC silicas
Author(s) -
Goraieb Karen,
Bueno Maria Izabel M. S.,
Collins Carol H.,
Collins Kenneth E.
Publication year - 2005
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.868
Subject(s) - x ray absorption spectroscopy , high performance liquid chromatography , fluorescence , titanium oxide , oxide , titanium , fluorescence spectroscopy , absorption (acoustics) , chemistry , x ray , chromatography , monolayer , nuclear chemistry , characterization (materials science) , materials science , absorption spectroscopy , analytical chemistry (journal) , organic chemistry , nanotechnology , optics , biochemistry , composite material , physics
Abstract Titanium oxide grafted on to the surfaces of chromatographic silica was investigated by x‐ray fluorescence (XRF) and x‐ray absorption (XAS) spectroscopy and the latter used before and after the extensive use of this material as a support for reversed‐phase high‐performance liquid chromatography (RP‐HPLC). XRF indicated the formation of a complete 2:1 monolayer whereas XAS suggested the presence of more than one titanium oxide structure. These structures show some slight modification after immobilization of PMOS and use in HPLC. Copyright © 2005 John Wiley & Sons, Ltd.