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Theoretical influence coefficients for correction of matrix effects in x‐ray fluorescence analysis of intermediate‐thickness samples
Author(s) -
Sitko Rafał
Publication year - 2005
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.867
Subject(s) - x ray fluorescence , matrix (chemical analysis) , analytical chemistry (journal) , materials science , mass spectrometry , fluorescence , chemistry , physics , optics , composite material , quantum mechanics , chromatography
Theoretical influence coefficients for x‐ray fluorescence analysis of intermediate‐thickness samples is proposed. The algorithm, derived from the Sherman equation, corrects simultaneously both absorption and enhancement effects in specimens with various thicknesses. The coefficients take into account all matrix elements, hence they have to be calculated using an iterative approach. Nevertheless, if matrix diversification is limited, the coefficients can be treated as constants for given mass per unit area of the specimen. Then the iteration can be avoided and calculations are simple and fast. The dependence of the influence coefficients on matrix composition and sample thickness is discussed. The validity of the proposed algorithm was checked with certified geological materials, four‐element polycrystals and ferroelectric ceramics using wavelength‐dispersive x‐ray spectrometry. Copyright © 2005 John Wiley & Sons, Ltd.