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Rapid chemical state analysis in air by highly sensitive high‐resolution PIXE using a v. Hamos crystal spectrometer
Author(s) -
Maeda Kuniko,
Hasegawa Kenichi,
Maeda Masaru,
Ogiwara Kiyoshi,
Hamanaka Hiromi
Publication year - 2005
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.853
Subject(s) - spectrometer , spectral line , chemical state , high resolution , analytical chemistry (journal) , sediment , sulfur , resolution (logic) , chemistry , materials science , mineralogy , environmental science , physics , optics , remote sensing , geology , environmental chemistry , nuclear magnetic resonance , computer science , x ray photoelectron spectroscopy , paleontology , organic chemistry , astronomy , artificial intelligence
A high‐resolution PIXE system composed of a curved crystal and a position‐sensitive proportional counter in v. Hamos geometry was constructed for rapid chemical state analysis in air. Data processing software to measure the time variation of PIXE spectra was installed in the system. The system was applied to obtain time‐resolved spectra of sulfur Kβ on the minute time‐scale. Time‐dependent variation of the fine structure was recognized clearly in the S Kβ spectra obtained from marine sediment samples. Copyright © 2005 John Wiley & Sons, Ltd.