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High‐energy PIXE using very energetic protons: quantitative analysis and cross‐sections
Author(s) -
Denker A.,
Bohne W.,
Campbell J. L.,
Heide P.,
Hopman T.,
Maxwell J. A.,
OpitzCoutureau J.,
Rauschenberg J.,
Röhrich J.,
Strub E.
Publication year - 2005
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.842
Subject(s) - proton , cross section (physics) , materials science , penetration depth , excitation , nuclear physics , analytical chemistry (journal) , physics , chemistry , optics , chromatography , quantum mechanics
Latterly, PIXE using high‐energy protons has been applied effectively for the qualitative analysis of archaeological and art objects, providing information from deep inside the object. This is due to the high cross‐sections for the excitation of K‐lines of heavy elements together with the large penetration depth of high‐energy protons, resulting in analysable depth of up to several millimetres. After the extension of the GUPIX software package to proton energies of up to 100 MeV, quantitative analysis came within reach. Measurements on thin and thick metal targets, and also on alloy standards with known composition and various thickness, were performed. The concentrations obtained were compared with the certified values. The agreement was good for samples with a thickness of around 2 mm. However, for several centimetre thick samples, the heavy elements were overestimated when using the K‐lines of these elements for the data evaluation. To clarify this, K‐shell cross‐section measurements were carried out for various Z . The measurements and the results are presented and discussed. Copyright © 2005 John Wiley & Sons, Ltd.