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Analysis of magnetic dust layers on Mars by PIXE and XRF
Author(s) -
Jensen J.,
Folkmann F.,
Gunnlaugsson H. P.,
Merrison J. P.,
Kinch K.,
Knudsen J. M.,
Nørnberg P.,
Bertelsen P.,
Madsen M. B.
Publication year - 2005
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.836
Subject(s) - mars exploration program , astrobiology , particle (ecology) , materials science , layer (electronics) , geology , environmental science , mineralogy , physics , composite material , oceanography
X‐ray analysis with the instruments on the rovers on Mars, landed in January 2004, and application to the thin dust layer accumulated on magnets on the rovers are discussed. Particle excitation and x‐ray fluorescence have different effective depths and call for a more elaborate analysis of a thin surface layer. Measurements from Mars are presented and exhibit a similar elemental composition of the accumulated magnetic dust to that of the surrounding soil. Copyright © 2005 John Wiley & Sons, Ltd.