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Chemical state analysis employing sub‐natural linewidth resolution PIXE measurements of Kα diagram lines
Author(s) -
Kavčič M.,
Karydas A. G.,
Zarkadas Ch.
Publication year - 2005
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.822
Subject(s) - aerosol , laser linewidth , resolution (logic) , proton , analytical chemistry (journal) , chemistry , sulfur , spectrometer , spectral line , high resolution , optics , physics , nuclear physics , laser , remote sensing , organic chemistry , chromatography , astronomy , artificial intelligence , computer science , geology
A high‐energy resolution crystal spectrometer in Johansson geometry, which allows energy resolution below the natural linewidth of the Kα diagram lines, was employed in the measurements of proton‐induced Kα x‐ray emission spectra of titanium and sulfur pure and compound targets. The results demonstrate a clear dependence of the Kα energy shifts on the chemical state of the element in the sample. This dependence permits the chemical state speciation of low‐ Z elements in an unknown sample by employing high‐resolution PIXE measurements of the Kα line. The potential of the technique in speciation studies is demonstrated in the case of an aerosol sample. The analysis of the Kα line obtained from the high‐energy resolution proton‐induced S Kα x‐ray spectrum allowed the identification of sulfur in the aerosol sample as sulfate ([SO 4 ] 2− ). Copyright © 2005 John Wiley & Sons, Ltd.