La/B 4 C small period multilayer interferential mirror for the analysis of boron | Zendy

André J.M. | Zendy; Jonnard P. | Zendy; Michaelsen C. | Zendy; Wiesmann J. | Zendy; Bridou F. | Zendy; Ravet M.F. | Zendy; Jérome A. | Zendy; Delmotte F. | Zendy; Filatova E. O. | Zendy

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La/B 4 C small period multilayer interferential mirror for the analysis of boron

Author(s) -

André J.M.,

Jonnard P.,

Michaelsen C.,

Wiesmann J.,

Bridou F.,

Ravet M.F.,

Jérome A.,

Delmotte F.,

Filatova E. O.

Publication year - 2005

Publication title -

x‐ray spectrometry

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.447

H-Index - 45

eISSN - 1097-4539

pISSN - 0049-8246

DOI - 10.1002/xrs.793

Subject(s) - boron , materials science , synchrotron radiation , optics , reflectometry , diode , wavelength , optoelectronics , analytical chemistry (journal) , chemistry , physics , nuclear physics , time domain , chromatography , computer science , computer vision

An La/B 4 C multilayer interferential mirror with small period d (4.8 nm) was produced by diode sputtering for the detection of the boron K emission by wavelength‐dispersive x‐ray spectrometry at a large Bragg angle (close to 45°). The structure of the mirror was characterized by grazing incidence x‐ray reflectometry and its performance at the energy of the boron K emission (183 eV) was evaluated by means of polarized synchrotron radiation. Spectrometric measurements showed that the La/B 4 C mirror improved the detection limit of boron using by a factor of 2 with respect to similar Mo/B 4 C mirrors and by a factor of 4 with respect to a lead stearate crystal. Copyright © 2005 John Wiley & Sons, Ltd.

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