Effect of crystal structure on the background intensity in XRF

A new model for the origin of diffraction peaks in x‐ray fluorescence was developed, using the concept of a virtual primary radiation source. The method offers the possibility of calculating the background intensity formed by characteristic radiation and bremsstrahlung. Bragg diffraction may significantly modify the intensity of primary radiation reflected by crystal planes of a polycrystalline material. Copyright © 2005 John Wiley & Sons, Ltd.