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Energy‐dispersive XRF spectrometer for Ti determination (TITAN)
Author(s) -
Cheburkin A. K.,
Shotyk W.
Publication year - 2004
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.766
Subject(s) - monochromator , analyser , analytical chemistry (journal) , spectrometer , monochromatic color , diffraction , titan (rocket family) , materials science , sample preparation , chemistry , mineralogy , optics , environmental chemistry , chromatography , physics , wavelength , optoelectronics , astronomy
An energy‐dispersive XRF analyser was designed and constructed for determining Ti in plant and peat materials at low (ppm) concentrations. The XRF analyzer for Ti analysis (TITAN) uses monochromatic excitation obtained from a crystal diffraction monochromator and Co target x‐ray diffraction tube. In addition to precise and sensitive analyses of Ti, other minor elements (Ca, K, Cl, S, P, Ba) in powdered plant and peat samples can be measured with only a minimum of sample preparation (drying, milling). The limits of detection obtained are K 2.5, Ca 1.5, Ti 0.9, Cr 0.7 and Mn 0.5 ppm using a 600 s acquisition time. The instrument was used to determine Ti concentrations in pre‐anthropogenic peat samples up to 9000 years old. Copyright © 2004 John Wiley & Sons, Ltd.