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Measurements of the surface ionization in multilayered specimens
Author(s) -
Merlet C.,
Llovet X.,
Salvat F.
Publication year - 2004
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.757
Subject(s) - ionization , tracer , monte carlo method , materials science , intensity (physics) , analytical chemistry (journal) , cover (algebra) , surface layer , layer (electronics) , surface (topology) , atomic physics , computational physics , molecular physics , chemistry , optics , physics , ion , composite material , geometry , nuclear physics , mathematics , mechanical engineering , statistics , organic chemistry , chromatography , engineering
Results from experimental measurements of surface ionization, Φ(0), from multilayered specimens are presented. The studied samples consisted of Cu and C layers of different thicknesses, deposited on single‐element substrates that cover the periodic system, from Be to Bi. The surface ionization was determined by the tracer method, i.e. by measuring the characteristic x‐ray intensity emitted from an ultra‐thin tracer layer deposited on the multilayer structure and, according to Castaing's definition, dividing it by the x‐ray intensity from an equivalent, self‐supporting tracer layer. The considered tracer element was Ni, and measurements were performed for Ni Kα and Ni Lα x‐rays. Experimental results are compared with Monte Carlo simulation results generated by using the general‐purpose simulation package PENELOPE with ionization cross‐sections computed from an optical‐data model. Measured data are also compared with the predictions of an empirical analytical expression for Φ(0), which was derived from systematic Monte Carlo simulations. Copyright © 2004 John Wiley & Sons, Ltd.