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EPMA mapping method for small particles of Al 3 Fe, Al 6 Fe, α‐AlFeSi and β‐AlFeSi in 1050‐H18 aluminum sheets
Author(s) -
Osada Yoshio
Publication year - 2004
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.755
Subject(s) - impurity , electron microprobe , aluminium , materials science , analytical chemistry (journal) , chemistry , metallurgy , organic chemistry , chromatography
We developed an EPMA mapping method for small Al a Fe b Si c particles in 1050‐H18 aluminum sheet, which is one of the base materials coated by photoresist in advance called PS plate (pre‐sensitized printing plate). In this method, we used the ratios of relative x‐ray intensities, I Fe / I Al and I Fe / I Si instead of the mass ratios, Fe/Al and Fe/Si, of the main elements which constitute the particles and tried to determine the ratios of relative x‐ray intensities using Monte Carlo calculations. Furthermore, using this developed mapping method, we performed the mapping of small Al a Fe b Si c particles such as Al 3 Fe (0–3%Si as impurities), Al 6 Fe (0–1%Si as impurities), α‐AlFeSi(Al 8.3 Fe 2 Si) and β‐AlFeSi(Al 8.9 Fe 2 Si 2 ) in 1050‐H18 aluminum sheets. We found that the discrimination of these particles was achieved with this mapping method. We confirmed that this method is useful for the mapping of Al a Fe b Si c particles in 1050‐H18 aluminum sheets. Copyright © 2004 John Wiley & Sons, Ltd.