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Photoelectron, Compton and characteristic x‐ray escape from an HPGe Detector in the range 8–52 keV
Author(s) -
Yılmaz Ercan,
Can Cüneyt
Publication year - 2004
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.746
Subject(s) - photoelectric effect , physics , semiconductor detector , range (aeronautics) , monte carlo method , detector , photon , spectral line , photon energy , x ray , atomic physics , compton scattering , energy (signal processing) , nuclear physics , materials science , optics , statistics , mathematics , quantum mechanics , astronomy , composite material
Abstract Escape of photoelectrons, Compton‐scattered photons and Ge x‐rays from an HPGe detector was studied as a function of energy in the range 8–52 keV. A variable‐energy source producing Cu, Rb, Mo, Ag, Ba, and Tb x‐rays was used. All three mechanisms for energy loss were observed in the same experiment for Ba and Tb, while only x‐ray and photoelectron escapes were evident in the spectra for Ag, Mo, Rb, and Cu. Spectral features and possible mechanisms for partial energy deposition were investigated. A Monte Carlo program was used to simulate the relevant interactions, and to estimate the escape probabilities. Copyright © 2004 John Wiley & Sons, Ltd.