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Semiconductor Peltier‐cooled detectors for x‐ray fluorescence analysis
Author(s) -
Sokolov A.,
Loupilov A.,
Gostilo V.
Publication year - 2004
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.744
Subject(s) - detector , cadmium telluride photovoltaics , thermoelectric cooling , fabrication , semiconductor , semiconductor detector , optoelectronics , thermoelectric effect , materials science , x ray detector , liquid nitrogen , physics , optics , medicine , alternative medicine , pathology , quantum mechanics , thermodynamics
We discuss recent results obtained in the development of Si(Li), Si p–i–n, CdTe p–i–n and CdZnTe x‐ray detectors with Peltier coolers for fabrication of laboratory and portable XRF analyzers. The characteristics of Si(Li) Peltier‐cooled detectors are close to those of detectors cooled with the liquid nitrogen and remain the most preferred type of detectors for the tasks of x‐ray fluorescence analysis. Considerable success was obtained in the improvement of the characteristics of CdTe p–i–n detectors and CdZnTe detectors with a metal–semiconductor–metal structure, effective in the energy range up to 100 keV. The spectra of all detectors are presented. Copyright © 2004 John Wiley & Sons, Ltd.