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EPMA and µ‐SRXRF analysis and TEM‐based microstructure characterization of a set of Roman glass fragments
Author(s) -
Fredrickx P.,
De Ryck I.,
Janssens K.,
Schryvers D.,
Petit J.P.,
Döcking H.
Publication year - 2004
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.734
Subject(s) - electron microprobe , microstructure , microanalysis , electron probe microanalysis , synchrotron radiation , opacity , characterization (materials science) , transmission electron microscopy , materials science , analytical chemistry (journal) , crystallography , mineralogy , physics , chemistry , optics , chromatography , organic chemistry
A set of Roman glass fragments, excavated at Bliesbruck–Reinheim (French–German border), were analysed by electron probe microanalysis (EPMA) and micro‐synchrotron radiation‐induced x‐ray fluorescence (µ‐SRXRF) in order to determine the major, minor and trace chemical composition. Based on this analysis, five classes of mono‐coloured glass could be discerned. However, one piece of this set was not mono‐coloured, but consisted of a mixture of brown and white opaque glass. This fragment was investigated using EPMA and transmission electron microscopy (TEM) in order to gain a better insight into its microstructure. Both colours proved to contain small crystalline inhomogeneities. Structural information reveals the form in which the detected elements are present and helps to explain the appearance (e.g. colour) of the material. Copyright © 2004 John Wiley & Sons, Ltd.