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The Dresden EBIT: a novel source of x‐rays from highly charged ions
Author(s) -
Kentsch U.,
Landgraf S.,
Zschornack G.,
Grossmann F.,
Ovsyannikov V. P.,
Ullmann F.
Publication year - 2004
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.702
Subject(s) - electron beam ion trap , atomic physics , ion , highly charged ion , ionization , electron , excitation , electron ionization , hydrogen , physics , ion source , chemistry , cathode ray , nuclear physics , quantum mechanics
The Dresden EBIT, a source of highly charged ions, is based on electron impact ionization of primarily neutral atoms in a high‐density electron beam. Inside the source x‐radiation originates from direct excitation, radiative recombination and dielectronic recombination processes. Since the energy of the exciting electrons is tunable, specific atomic states can be prepared for particular investigations. The intensity of the x‐ray flux allows the realization of energy‐ and wavelength‐dispersive x‐ray spectrometry of highly charged ions. Spectra of helium‐ and hydrogen‐like titanium and zinc ions are shown as examples. Copyright © 2004 John Wiley & Sons, Ltd.