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Escape of photoelectrons and Compton‐scattered photons from an HPGe detector
Author(s) -
Can Cüneyt
Publication year - 2003
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.650
Subject(s) - photoelectric effect , physics , photon , monte carlo method , detector , nuclear physics , compton scattering , semiconductor detector , photon energy , atomic physics , optics , statistics , mathematics
The response function of a planar HPGe detector due to escape of photoelectrons and Compton‐scattered photons was studied for a point source with 59.5 keV energy. It was shown that both mechanisms, in addition to Ge x‐ray escape, leading to partial deposition of energy, could be observed in the same experiment. A Monte Carlo program was used to investigate these components of the response function. The results indicate that although the escape of scattered photons and Ge x‐rays are of the same magnitude, the escape of photoelectrons plays a more important role in the efficiency of a detector. Copyright © 2003 John Wiley & Sons, Ltd.