Premium
Methodical peculiarities of x‐ray electron probe microanalysis as a promising method to study environmental samples
Author(s) -
Pavlova Ludmila A.,
Belozerova Olga Yu.,
Paradina Ludmila Ph.
Publication year - 2002
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.574
Subject(s) - electron microprobe , microanalysis , electron probe microanalysis , certified reference materials , analytical chemistry (journal) , chemistry , barium , pollution , mineralogy , environmental pollution , environmental chemistry , materials science , environmental science , metallurgy , chromatography , detection limit , organic chemistry , ecology , environmental protection , biology
The use of x‐ray electron probe microanalysis (EPMA) techniques for environmental objects samples was investigated. Several ZAF and two ϕ(ρ z ) methods, PAP and the original bi‐exponential model of matrix corrections, were used. The EPMA calculation technique was developed for approximately spherical individual particles of snow‐contained sediments commensurate in size with the area of x‐ray generation. An analytical equation for the size correction of spherical individual particles is proposed. The technique for selecting the optimum EPMA conditions for destruction is reported. Various procedures of the sample preparation were used. Certified basalt glasses containing small amounts of strontium and barium were prepared as reference samples for EPMA. All these procedures provide satisfactory results when applied to the analysis of snow‐contained sediments, coal ash and bones of animals and fish. These samples were investigated with the aim of using them as indicators for evaluating the pollution level of the lower atmosphere and surface and ground water and for revealing pollution mechanisms. The features of EPMA were considered in all studies and the certification characteristics of the techniques were determined. Copyright © 2002 John Wiley & Sons, Ltd.