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Optimization of K‐shell intensity ratios in electron probe microanalysis
Author(s) -
Castellano G.,
Bonetto R.,
Trincavelli J.,
Vasconcellos M.,
Campos C.
Publication year - 2002
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.566
Subject(s) - bremsstrahlung , intensity (physics) , electron microprobe , microanalysis , electron probe microanalysis , analytical chemistry (journal) , electron , chemistry , atomic physics , atomic number , physics , optics , mineralogy , nuclear physics , organic chemistry , chromatography
A method for refinement of atomic and experimental parameters was applied to the optimization of K‐shell intensity ratios in electron probe microanalysis (EPMA). This kind of procedure, previously used in x‐ray diffraction, is shown to be a powerful tool in EPMA. The method consists of minimizing the differences between an experimental x‐ray spectrum and a function proposed to account for the bremsstrahlung and characteristic peaks from the corresponding sample, and also for detection artifacts. In this work, the method was used for the determination of transition rates. This procedure was applied to 14 elements with atomic numbers ranging from 20 to 42. The results obtained are in agreement with theoretical and experimental data for K α /(K β + K α ) intensity ratios. In addition, K α 1 , K α 2 , K β 1 , and K β 2 relative intensities were compared with experimental data, showing a similar behaviour. Copyright © 2002 John Wiley & Sons, Ltd.