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Comparative material characterization of historical and industrial samples by using a compact micro‐XRF spectrometer
Author(s) -
Bichlmeier S.,
Janssens K.,
Heckel J.,
Hoffmann P.,
Ortner H. M.
Publication year - 2002
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.563
Subject(s) - characterization (materials science) , ceramic , materials science , spectrometer , metallurgy , computer science , nanotechnology , physics , optics
An experimental micro‐XRF set‐up was used for investigations in different application fields. In the archaeometric field, valuable 7th century gold objects were analysed with the aim of obtaining concentration data on well‐defined metal areas. The results revealed an insight into the gold manufacturing habits of early medieval times. In the industrial field, piezoelectric ceramics were investigated in order to identify small inclusions in the material. The aim was to identify possible contamination sources in the manufacturing process. Copyright © 2002 John Wiley & Sons, Ltd.