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An overview of x‐ray spectrometry at research centers in Chile
Author(s) -
RomoKröger C. M.,
CornejoPonce L.,
Morales J. R.,
Dinator M. I.,
Avila M. J.,
Poblete V. H.,
Galvez J.,
Goldschmidt A.,
Trier A.,
Valdes J.,
Rojas C. M.,
Cantillano M. E.,
Vera R.,
Figueroa R.,
Garcia M.
Publication year - 2002
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.558
Subject(s) - x ray fluorescence , microprobe , electron microprobe , gamma ray spectrometry , mass spectrometry , x ray , analytical chemistry (journal) , reflection (computer programming) , field (mathematics) , excited state , x ray spectroscopy , spectroscopy , physics , engineering physics , mineralogy , computer science , chemistry , optics , fluorescence , atomic physics , environmental chemistry , radiochemistry , mathematics , astronomy , quantum mechanics , pure mathematics , programming language
Different procedures have been used to develop x‐ray fluorescence spectroscopy in Chile. In this paper we describe those groups doing basic or applied scientific research, mainly associated with units at universities and research centers. The techniques are PIXE, common XRF, XRF excited with gamma sources, x‐ray emission from an electron microprobe and the total reflection technique. Historical aspects and experimental features are mentioned. Theoretical and methodological projects are also described. Finally, the wide field of applications of XRF in Chile is presented. Copyright © 2002 John Wiley & Sons, Ltd.