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Soft x‐ray fluorescence measurements in materials science
Author(s) -
Kurmaev E. Z.,
Moewes A.,
Ederer D. L.
Publication year - 2002
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.552
Subject(s) - fluorescence , polymer , materials science , superconductivity , transition metal , nanotechnology , ion , x ray photoelectron spectroscopy , chemistry , physics , optics , composite material , condensed matter physics , nuclear magnetic resonance , organic chemistry , catalysis
A short review of applications of soft x‐ray emission spectroscopy for the study of electronic structure and chemical bonding of advanced materials is presented. It is shown that this technique is very efficient for characterizing different materials such as transition metal compounds, layered superconductors, conducting polymers, metal/polymer interfaces and ion‐implanted insulators. Copyright © 2002 John Wiley & Sons, Ltd.