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The transistor and energy‐dispersive x‐ray spectrometry: roots and milestones in x‐ray analysis
Author(s) -
Ryon Richard W.
Publication year - 2001
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.511
Subject(s) - x ray , transistor , semiconductor , mass spectrometry , solid state , electronics , materials science , optoelectronics , analytical chemistry (journal) , physics , nanotechnology , engineering physics , chemistry , optics , environmental chemistry , quantum mechanics , voltage
Abstract The story of energy‐dispersive x‐ray spectrometry was preceded by a long evolutionary history of solid‐state physics and semiconductor electronics. The beginning may be said to have been with the recognition of the special properties of rectifying crystals. We follow this story from its roots through recent innovations that point the way to the future of this method of chemical analysis. Published in 2001 by John Wiley & Sons, Ltd.