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Size and origin of the escape peak in various Si(Li) detectors
Author(s) -
Papp T.,
Campbell J. L.
Publication year - 2001
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.459
Subject(s) - detector , variation (astronomy) , energy (signal processing) , physics , variable (mathematics) , materials science , analytical chemistry (journal) , optics , chemistry , mathematics , astrophysics , mathematical analysis , quantum mechanics , chromatography
The variation of the escape peak to parent peak intensity ratio among nine Si(Li) detectors was studied using an 55 Fe source. We selected detectors of widely different overall lineshape response, all from commercial suppliers. We used a sophisticated non‐linear fitting code to model the underlying background and the demonstrably variable low‐energy tailing features. The resulting escape to parent peak ratio exhibits considerable variation for the different detectors. Copyright © 2001 John Wiley & Sons, Ltd.