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Spectrometer configuration and measurement uncertainty in X‐ray spectroscopy
Author(s) -
Redus Robert,
Huber Alan,
Dubay Robert
Publication year - 2020
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.3209
Subject(s) - spectrometer , x ray spectroscopy , spectroscopy , x ray , physics , materials science , optics , astronomy
How should one select the best detector and the best spectrometer configuration for a particular measurement in X‐ray spectroscopy? The end user is typically interested in obtaining the best precision, accuracy, and detection limit but these are indirectly related to the typical spectrometer specifications, such as energy resolution measured with 55 Fe, maximum count rate, or detector area. In this article, we will quantify how the measurement uncertainty (precision, accuracy, and detection limit) are related to spectrometer parameters. We will derive the relationships for common measurement cases, will show data validating these relationships, and will indicate how this information can be used to select the optimum detector and spectrometer configuration for specific applications.