Premium
Investigation of mass attenuation coefficients of copper–silver thin films at 14.93–48.82 keV energy range
Author(s) -
Söğüt Ömer,
Cengiz Erhan,
Yavuz Musab
Publication year - 2020
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.3199
Subject(s) - attenuation , copper , analytical chemistry (journal) , mass attenuation coefficient , range (aeronautics) , photon , thin film , evaporation , atomic physics , chemistry , materials science , physics , optics , nanotechnology , metallurgy , thermodynamics , chromatography , composite material
In this study, the mass attenuation coefficients of copper–silver thin‐film alloys, produced by the thermal evaporation method at various concentrations, were measured at six different energies in the range of 14.93–48.82 keV (keV) by X‐ray Fluorescence technique (XRF). A 241 Americium radioisotope source, having 50 mCi intensity and 59.54 keV energy photons, was used to stimulate the samples, and an Ultra‐LEGe detector was used to count the characteristic X‐rays emitted from the samples and from the source. At 14.93, 17.44, and 23.10 keV energies, the mass attenuation coefficients of Cu–Ag thin‐film alloys increased with increasing Cu concentration, while decreasing with increasing Cu concentration at 27.37, 32.068, and 48.82 keV energies. However, at 14.93, 17.44, and 23.10 keV energies, the mass attenuation coefficients decreased with increasing Ag concentration, while increasing with increasing Ag concentration at 27.37, 32.068, and 48.82 keV energies. The obtained results were compared with the values theoretically predicted by XCOM, and the experimental results are in good agreement with theoretical values within the error limits.