X‐ray scattering and polarization in wavelength‐dispersive spectrometers

Background suppression is discussed in wavelength‐dispersive polarization X‐ray spectrometer (WDPXRS), in which the goniometer scans in plane perpendicular to primary and secondary beams. Background suppression coefficients in WDPXRS and energy‐dispersive polarization X‐ray spectrometer are determined by different expressions (in “The scattering suppression of X‐rays with energy of 20–200 keV in spectrometers with Barkla polarizers,” doi: 10.1002/xrs.3046). It is proposed to install silicon drift detectors in WDPXRS and implement energy‐dispersive and wavelength‐dispersive modes in one channel.