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System for coincidence measurements of the ions desorbed and projectiles scattered from noble gas solid surfaces by slow multiply charged ion impacts
Author(s) -
Sawa Hiroyoshi,
Uchida Shuntaro,
Ueta Hirokazu,
Hirayama Takato
Publication year - 2019
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.3060
Subject(s) - projectile , ion , noble gas , coincidence , atomic physics , scattering , solid surface , materials science , chemistry , physics , optics , chemical physics , medicine , alternative medicine , organic chemistry , pathology , metallurgy
We have developed a new experimental apparatus for performing coincidence measurements of the ions desorbed and projectiles scattered from the surfaces of noble gas solids by slow multiply charged ion impacts at grazing incidence angles. This simultaneously measures the desorbed ions' flight times and the scattered projectiles' charge states. We also conduct experiments on 6 keV Ar 6+ impacts onto a solid Ne surface using the device.