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Development of an experimental database of EUV spectra from highly charged ions of medium to high Z elements in the Large Helical Device plasmas
Author(s) -
Suzuki Chihiro,
Murakami Izumi,
Koike Fumihiro,
Higashiguchi Takeshi,
Sakaue Hiroyuki A.,
Tamura Naoki,
Sudo Shigeru,
O'Sullivan Gerry
Publication year - 2019
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.3058
Subject(s) - ion , spectral line , extreme ultraviolet lithography , plasma , extreme ultraviolet , excited state , krypton , atomic physics , wavelength , ultraviolet , spectrometer , tin , materials science , chemistry , argon , physics , laser , optics , optoelectronics , organic chemistry , quantum mechanics , astronomy , metallurgy
We are developing an experimental database of extreme ultraviolet spectra from highly charged ions using optically thin high‐temperature plasmas produced in the Large Helical Device. Spectra from a variety of elements with atomic numbers ranging from 36 to 83 have been systematically recorded in the range of 1–20 nm by a grazing incidence spectrometer. For higher Z elements from tin onward, discrete or quasicontinuum spectral features from n =4 ( N ‐shell) ions are mainly observed depending upon the plasma temperature, which leads to some new experimental identifications of spectral lines. On the other hand, major emitters are n =3 ( M ‐shell) ions for medium Z elements from krypton to ruthenium. The calculated wavelengths for Δ n ≠0 transitions agree well with the measurements and the calculated wavelengths are systematically shifted to shorter wavelengths for Δ n =0 transitions associated with inner‐subshell excited configurations.