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Single and double electron capture associated with target K‐shell ionization for F 7 + ,8 + ,9+ +Ar
Author(s) -
La Mantia David,
Kumara P. N. S.,
Kayani Asghar,
Tanis John
Publication year - 2019
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.3053
Subject(s) - van de graaff generator , projectile , atomic physics , electron capture , ionization , electron shell , double ionization , electron , physics , range (aeronautics) , coincidence , tandem , neon , shell (structure) , nuclear physics , argon , ion , materials science , medicine , beam (structure) , pathology , alternative medicine , quantum mechanics , optics , composite material
Ratios for target Ar K‐shell ionization associated with single and double electron capture, as well as the ratios corresponding to total capture and the projectile K x rays, were determined for 1.8‐ to 2.2‐MeV/u F 7 + ,8 + ,9+ projectiles. This work was performed at Western Michigan University with the tandem Van de Graaff accelerator. Coincidences between emitted K‐shell X‐rays (both target and projectile) and the corresponding charge‐changed particles were observed. The F 9+ Ar K X‐ray coincidence ratios for double to single capture are found to well exceed unity over the limited energy range of the measurements. Possible explanations for this anomalous behavior are discussed.