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Instrumental detection limit and sensitivity of K and L shell X‐ray emission lines of 17 Cl, 37 Rb, and 38 Sr elements using PC‐WDXRF spectrometer
Author(s) -
Kainth Harpreet Singh,
Singh Tejbir,
Shahi Jangvir Singh,
Mehta Devinder,
Kumar Sanjeev
Publication year - 2018
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2950
Subject(s) - detection limit , analytical chemistry (journal) , spectrometer , calibration , spectral line , fluorescence , emission spectrum , sensitivity (control systems) , calibration curve , x ray , x ray fluorescence , mass spectrometry , chemistry , wavelength , atomic physics , materials science , physics , optics , chromatography , quantum mechanics , astronomy , electronic engineering , engineering
This work was aimed to improve the instrumental detection limit and sensitivity of 17 Cl, 37 Rb, and 38 Sr elements present in solid samples by using the advanced polychromatic wavelength dispersive X‐ray fluorescence spectrometry method. Instrumental measuring parameters, as well as study of calibration curves of K and L shell spectral lines, were evaluated to select the best conditions for 17 Cl, 37 Rb, and 38 Sr quantification. From the results, it was observed that the detection limits of the Rb Kα and Sr Kα spectral lines were lower than those of the Kβ 1,3 and Lα spectral lines. From the calibration curves, it was concluded that Kα spectral lines are more suitable than Kβ 1,3 and Lα lines to identify the traces of 17 Cl, 37 Rb, and 38 Sr elements in different types of solid samples.