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Quantitative analysis of Mo–Si–B alloy phases with wavelength dispersive spectroscopy (WDS–SEM)
Author(s) -
Kellner P.M.,
Dijkstra H.,
Glatzel U.
Publication year - 2017
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2824
Subject(s) - boron , spectroscopy , analytical chemistry (journal) , energy dispersive x ray spectroscopy , materials science , scanning electron microscope , microanalysis , wavelength , characterization (materials science) , alloy , spectrometer , x ray spectroscopy , calibration , boro , optics , chemistry , metallurgy , optoelectronics , nanotechnology , physics , chromatography , organic chemistry , quantum mechanics , composite material
Mo–Si–B alloys show great potential as high temperature materials. Due to peak overlapping of B‐K α and Mo‐M ζ , analyzing these alloys with microanalysis presents a real challenge. This paper describes the analytical methodology used to qualify and quantify the boron content in these alloys without stoichiometric reference samples by the use of a single parallel‐beam wavelength dispersive spectrometer. Characterization of boron is performed by using a coupled energy dispersive X‐ray spectroscopy—wavelength dispersive spectroscopy system in a scanning electron microscope. Self‐made pure element samples are used for calibration and quantification of the boron content.