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Elemental and chemical state depth analysis by combined use of a polycapillary and a thin wire in a synchrotron X‐ray microprobe
Author(s) -
Iida Atsuo
Publication year - 2017
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2750
Subject(s) - microprobe , xanes , resolution (logic) , synchrotron , sample (material) , optics , materials science , analytical chemistry (journal) , enhanced data rates for gsm evolution , x ray , channel (broadcasting) , absorption (acoustics) , thin film , chemistry , mineralogy , physics , spectral line , nanotechnology , chromatography , computer science , telecommunications , artificial intelligence , computer network , astronomy
A simple method is proposed to improve the depth resolution of a conventional X‐ray confocal microscopy system by adding a thin wire close to the sample surface and upstream of the polycapillary in the exit channel. A depth resolution of around 10 μm is easily obtained. The detection efficiency is improved by a factor of two to three times, compared with the thin wire technique previously proposed. It is also shown that not only the elemental distribution but also the X‐ray absorption near‐edge structure (XANES) spectrum from locations below the sample surface can be obtained. Copyright © 2017 John Wiley & Sons, Ltd.