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Artificial peaks in energy dispersive X‐ray spectra: sum peaks, escape peaks, and diffraction peaks
Author(s) -
Tanaka Ryohei,
Yuge Koretaka,
Kawai Jun,
Alawadhi Hussain
Publication year - 2016
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2697
Subject(s) - diffraction , spurious relationship , impurity , spectral line , energy (signal processing) , intensity (physics) , trace (psycholinguistics) , analytical chemistry (journal) , computational physics , physics , chemistry , optics , mathematics , statistics , quantum mechanics , chromatography , linguistics , philosophy
Sum peaks, escape peaks, and diffraction peaks are considered artificial or spurious peaks in energy dispersive X‐ray spectrometry. Experimental examples are given, which showed that escape and diffraction peaks can add up to become sum peaks. These artificial peaks are not weak, and great care must be taken to differentiate them from peaks due to impurity or trace elements. The relationship between the intensity of a sum peak and the original peaks is illustrated using computer simulation as well as probability theory. Copyright © 2016 John Wiley & Sons, Ltd.