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An interactive graphical user interface (GUI) for the CATGIXRF program – for microstructural evaluation of thin film and impurity doped surfaces
Author(s) -
Tiwari M. K.,
Das Gangadhar
Publication year - 2016
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2692
Subject(s) - graphical user interface , materials science , synchrotron radiation , thin film , interface (matter) , software , synchrotron , impurity , x ray reflectivity , user interface , surface finish , computer science , optics , nanotechnology , chemistry , physics , operating system , composite material , capillary number , organic chemistry , capillary action
This paper is a continuation and extension of our earlier work ( X‐ray Spectrom . 2010 , 39, 127–134, DOI:10.1002/xrs.1215) on the development of a software platform CATGIXRF , as a solution to provide non‐destructive evaluation of nanostructured materials. Here, we describe an interactive graphical user interface (GUI) for the CATGIXRF program. The newly developed GUI interface facilitates determination of microstructural parameters on angstrom length scale for the nanostructured thin layered materials using synchrotron as well as laboratory X‐ray sources. It allows combined analysis capabilities for both the X‐ray reflectivity and grazing incidence X‐ray fluorescence (GIXRF) data simultaneously, thus enabling us a greater sensitivity for the determination of microstructural parameters such as thickness, interface mixing, and roughness of a thin film medium with improved accuracies. The utility and various newly added salient features of the GUI‐CATGIXRF program are described by providing example calculations as well as by analyzing experimentally a few thin film structures with different surface‐interface properties. Copyright © 2016 John Wiley & Sons, Ltd.