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Unit‐cell dimensions of α‐MnTe in the 295 K – 1200 K temperature range
Author(s) -
Minikayev R.,
Dynowska E.,
Witkowska B.,
Bell A. M. T.,
Szuszkiewicz W.
Publication year - 2015
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2646
Subject(s) - diffractometer , diffraction , atmospheric temperature range , powder diffraction , synchrotron radiation , powder diffractometer , rietveld refinement , materials science , decomposition , impurity , range (aeronautics) , synchrotron , analytical chemistry (journal) , crystallography , chemistry , optics , crystal structure , physics , thermodynamics , organic chemistry , chromatography , composite material
Unit cell dimensions of high‐quality MnTe crystals with NiAs structure were analyzed at temperatures ranging from 295 K to 1200 K. First, the X‐ray diffraction were carried out on powdered sample at room temperature using the laboratory diffractometer. Next, the diffraction patterns in a wide temperature range were accumulated with the use of synchrotron radiation. The Rietveld refinement to all experimental data was applied. The average values of linear expansion coefficients in a and c direction are reported. The observed presence of MnTe 2 impurity phase in the temperature range from about 500 K to 1050 K is attributed to decomposition of a small fraction of MnTe during heating. Copyright © 2015 John Wiley & Sons, Ltd.
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