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Fluctuations in the processes of charge induction in ionization‐type detectors
Author(s) -
Samedov Victor V.
Publication year - 2015
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2598
Subject(s) - ionization , detector , charge (physics) , charge carrier , semiconductor detector , atomic physics , trapping , helium ionization detector , physics , discharge ionization detector , resolution (logic) , optoelectronics , ion , optics , ecology , quantum mechanics , artificial intelligence , computer science , biology
The energy resolution of ionization‐type detectors, i.e. semiconductor detectors and liquid ionization detectors, is determined not only by the variance in the number of charge carriers produced by X‐rays but also by fluctuations in the process of charge induction on the detector electrodes. The trapping of charge carriers and the resultant decrease in charge collection efficiency degrades the line shape of spectral peaks produced by X‐ray spectrometers. In this work, the characteristic function of the process of charge induction on electrodes of an ionization‐type detector with accounting for charge carrier trapping was derived. This characteristic function allowed deriving the general expression for the moments of the distribution function as well as the formulae for the mean value and the variance of the charge induced on the detector electrodes. These formulae are useful for analysis of the influence of the charge transport on the energy resolution of ionization‐type detectors. Copyright © 2015 John Wiley & Sons, Ltd.