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Determination of kernel emission spectrum of a mini X‐ray tube for EDXRF applications
Author(s) -
Díaz Alfredo,
Parra Cristian,
Valdés Christian,
Santibañez Mauricio,
Figueroa Rodolfo G.
Publication year - 2015
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.2584
Subject(s) - detector , optics , silicon drift detector , collimated light , physics , attenuation , emission spectrum , computational physics , kernel (algebra) , spectral line , materials science , mathematics , laser , combinatorics , astronomy
Knowing the spectrum near the output of the relatively new mini X‐ray tube (MXRT) commercial models is fundamentally important in energy‐dispersive X‐ray fluorescence scan images, especially in the in vivo applications. This information is relevant for determining the absorbed dose during a measurement and for absolute quantification by a fundamental parameter method. However, it is not possible to measure it directly using a silicon drift detector (SDD) given the high saturation in the counts. In this work, an experimental methodology is developed for determining the kernel spectrum emitted by the MXRT, enabling the quantification of its energy flux density over short distances. Different distances were used: source–detector, solid emission angle (collimation), attenuation characteristics of the medium (air), and in a vacuum, within an energy range of 1–40 keV, to determine the X‐ray tube spectrum. The spectrum is measured by an SDD, taking its efficiency and dead time into account. In order to verify the method, a spectrum that is rebuilt starting with the kernel is compared, under the same conditions, with a reference spectrum that is directly measured in air and with a theoretical spectrum obtained by the Ebel model. The results are consistent and validate the methodology employed in this work. Additionally, low‐energy peaks were detected, corresponding to the tube material's L lines, which are not present in the original spectrum reported by the manufacturer. Copyright © 2015 John Wiley & Sons, Ltd.